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Автор: Meeker W.Q., Escobar L.
Год: 1998
Издание:
[не указано]
Страниц: [не указано]
ISBN: [не указан]
Explains computer-based statistical methods for reliability data analysis and test planning for industrial products. Demonstrates how to apply the latest graphical, numerical, and simulation-based methods to a broad range of models found in reliability data analysis, and covers areas such as analyzing degradation data, simulation methods used to complement large-sample asymptotic theory, and data analysis computed with the S-PLUS system. Includes chapter exercises using real data sets. For professionals in product reliability and design, and for graduate students in courses in applied reliability data analysis.
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